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MET 424 Metrology and Quality Control Exam 2022

MET 424: A 3-page End of Semester Examination for Metrology and Quality Control (MET424), University of Buea College of Technology, instructor Tala, dated 11th June 2022, Academic Year 2021/2022, credit value 3, time allowed 2 hours. Section A: 15 multiple-choice questions on parallax error, instrument range/precision/accuracy, measurement uncertainty sources, the SI definition of the metre, line versus end measurement, line versus end standard parallax, GD&T feature control frames, shaft-basis-system deviations, micrometer construction and precision, and light-wave (interferometric) measurement including dark-fringe conditions. Section B: dimension-transfer instruments and scale-versus-rule definitions; unilateral/bilateral tolerance definitions with examples; the chief difference between length and angle standards; a full hole/shaft tolerance-stack calculation (max/min clearance, tolerances, allowance, maximum material limits, type of fit); vernier-instrument forward/backward classification, least count, and a reading calculation; assessment of four optical-flat fringe patterns for surface flatness/curvature; and an NPL flatness-interferometer flatness-error calculation from fringe counts.

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University of Buea

College of Technology - COT

Mechanical Engineering - MET

MET4242022

Metrology and Quality Control

Exam · Second Semester · Level 400

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3.
Which of the following defines parallax error? (a) Same as observational error (b) Apparent shift of an object when the position of the observer is altered (c) Error caused by the distance between the scale and the measured feature (d) Mean of the values of measurements when the object is observed from the right and from the left.
6.
When a steel rule is used, which of the following is the source of measurement uncertainty? (a) Inherent instrument error, temperature error, and manipulative error (b) Attachment error, manipulative error, and temperature error (c) Attachment error, bias, and inherent instrument error (d) Inherent instrument error, manipulative error, and observational error.