EEF 469 Microelectronics Exam 2022
About this paper
EEF 469 Microelectronics 2021/2022 exam (Level 400), Faculty of Engineering and Technology, University of Buea: PN junction carrier densities.
Opens this paper in the app on your phone.
University of Buea
Faculty of Engineering and Technology - FET
Electrical and Electronic Engineering - EEF
Microelectronics
Exam · First Semester · Level 400
From this paper
- 1.
An abrupt silicon p-n junction consists of a p-type region containing 2 × 10 16 cm −3 acceptors and 10 15 cm −3 donors. It also has an n-type region containing 10 16 cm −3 acceptors in addition to 10 17 cm −3 donors. Calculate the thermal equilibrium density of electrons and holes in the p-type region as well as both densities in the n-type region. (10 pts)
- 3.
Derive the expression for the barrier potential (φnp) in a PN junction semiconductor material. (10 pts)
At a glance
- Course code
- EEF469 (EEF 469)
- Type
- Exam
- Year
- 2022
- Level
- Level 400
- Semester
- First Semester
- Proposed solution
- Included
Where it's from
University
University of BueaFaculty
Faculty of Engineering and Technology - FETDepartment
Electrical and Electronic Engineering - EEF
Read EEF469 2022 in Shoracy.
- Every page, with zoom for diagrams and small print
- The proposed solution, one tap away
- Stays on your phone after the first open, even offline
Don't have the app yet?